Abstract

Fresh spores of Equisetum arvense L. were irradiated for 5s, 15s, 30s or 60s, and examined with a transmission electron microscope. Alterations to the fine structure of the spore wall and the protoplasm are described. The exospore was more resistant to X-ray irradiation than to organic solvents, in particular diethylamine. The molecular structure of the spore wall was revealed by the X-ray effect. Resistance of the different layers of the sporomorphs to irradiation and organic solvents is important for understanding the complicated biopolymer system of the sporopollenin.

中文摘要

以X射線照射問荊(Equisetum arvense L.) 之孢子各5秒、15秒、30秒或60秒後，利用穿透式電子顯微鏡觀察其孢子壁與原生質微細構造之變化。結果發現，問荊之外孢子對於X射線的抗力較對二乙胺有機溶劑的抗力大，而孢子壁的分子結構亦可藉由X射線照射顯現出來。由本研究可知，孢子壁各層次對於放射線及有機溶劑的抗性表現不同，故可藉此瞭解孢粉質的生物多聚體系統構造。 關鍵詞：問荊孢子，微細構造，X射線效應。

Keyword: Equisetum spore, Ultrastructure, X-ray effect.